Metrology for Radar Systems



Alfonso Farina

LFIEEE, Distinguished Lecturer of AESS

Alfonso FARINA, doctor degree in Electronic Engineering, University of Rome (IT) (1967-1973). LFIEEE, FIET, FREng, Fellow of EURASIP.
In 1974, he joined Selenia, then Selex ES, where he became Director of the Analysis of Integrated Systems Unit and subsequently Director of Engineering of the Large Business Systems Division. In 2012, he was Senior VP and Chief Technology Officer of the Company, reporting directly to the President. From 2013 to 2014, he was senior advisor to the CTO. He retired in October 2014. From 1979 to 1985, he was also professor of “Radar Techniques” at the University of Naples (IT). Today, He is a Visiting Professor at University College London (UCL), Dept. Electronic and Electrical Engineering, CTIF (Center for TeleInFrastructures) Industry Advisory Chair, and a Distinguished Lecturer (DL) of IEEE AESS. He is a consultant to Leonardo S.p.A. “Land & Naval Defence Electronics Division” (Rome),
Alfonso is the author of more than 700 peer-reviewed technical papers and of books and monographs (published worldwide), some of them also translated in to Russian and Chinese.
Since few decades, He collaborates with several professional journals and conferences (mainly on radar and data fusion) as associate editor, reviewer, organizer of special issues, session chairman, plenary speaker, etc. Since 2017, He is IEEE-SP Magazine senior editorial board member (3-year term).
He has been conference general chairman of the IEEE RadarCon 2008, May 2008, Rome (IT), and Executive Conference Chair at the Intl. Conf. Fusion July 2006, Florence.
Some of the most significant awards he has received include: (2004) Leader of the team that won the First Prize of the first edition of the Finmeccanica Award for Innovation Technology, out of more than 330 submitted projects by the Companies of Finmeccanica Group; (2005) International Fellow of the Royal Academy of Engineering, U.K., the fellowship was presented to him by HRH Prince Philip, the Duke of Edinburgh; (2010, IEEE Honor Ceremony, Montreal (Ca)) IEEE Dennis J. Picard Gold Medal for Radar Technologies and Applications for “Continuous, Innovative, Theoretical, and Practical Contributions to Radar Systems and Adaptive Signal Processing Techniques”; (2012) Oscar Masi award for the AULOS® “green” radar by the Italian Industrial Research Association (AIRI); (2014) IET Achievement Medal for “Outstanding contributions to radar system design, signal, data and image processing, and data fusion. (2017) IEEE SPS Industrial Leader Award for contributions to radar array processing and industrial leadership.
Main received best paper awards are B. Carlton of IEEE – Trans. on AES (2001, 2003, 2013), IET – Proc. on Radar Sonar and Nav. (2009-2010) and Int. Conf. on Fusion (2004, 2009).
Please, see also:
"A CONVERSATION WITH FRIEND: ALFONSO FARINA", interviewer: Fulvio GINI, IEEE AES SYSTEMS MAGAZINE, June 2016, pp. 41-49. IEEE Aerospace and Electronic Systems Society.


Papers are being collected from university researchers, from industries specialized in conceiving, designing, installing, operating and testing radar systems for civilian and defense applications, from users and governmental/international agencies. Authors are also invited from industries that provide instruments to test radar performances. The scope of the special session is to have a wide view of the methods, instruments and practical experience to test subsystems and radar systems (for land based, shipborne, on drones, aircraft and satellites).
Topics of relevance for the session are: instrument test equipment for verification and validation in the industry, at the customer site, on the operational fields. Automation and remote test equipment will be of special interest. Virtual reality technologies are also most welcome as topics of the session.
Other topics relevant to the session are: radar system architectures and related digital and software technologies at the state of the art.


Description: To recognize the most outstanding paper presented at the annual IEEE International Workshop on Metrology for Aerospace as part of the Special Session on Metrology for Radar Systems.

Basis for Judging: Technical merit, originality, potential impact on the field, clarity of the written paper, and quality of the oral or other presentation.

With the Patronage of


In Collaboration with