Metrology for Radar Systems



Alfonso Farina

LFIEEE, Distinguished Lecturer of AESS

ALFONSO FARINA received the Doctor Degree in electronic engineering from the University of Rome, Italy, in 1973. In 1974, he joined Selenia, now Selex ES, where he has been a Manager since 1988. Currently, he is the Senior Advisor of the Chief Technical Officer of Selex ES.
In his professional life, he has provided technical contributions to detection, signal, data, image processing, and fusion for the main radar systems conceived, designed, and developed in the company. He has provided leadership in many projects in surveillance for ground and naval applications, in airborne early warning and in imaging radar. From 1979 to 1985, he was also Professor of radar techniques at Naples University; in 1985, he was appointed Associate Professor.
He is the author of more than 500 peer-reviewed technical publications and the author of books and monographs: Radar Data Processing (Vol. 1-2), which were translated in Russian and Chinese (1985–1986); Optimized Radar Processors (London, IEE, Peregrinus. 1987); and Antenna Based Signal Processing Techniques for Radar Systems (Artech House, 1992). He wrote the chapter “ECCM Techniques” in the Radar Handbook (McGraw-Hill, 1990, and 2008), edited by Dr. M. Skolnik. Farina has more than 4500 Google scholar citations, a Web of Knowledge h-index equal to 23, and an Erdos number equal to 4.
Dr. Farina has been session chairman at many international radar conferences. In 1987, he received the Radar Systems Panel Award of IEEE AESS for development of radar data processing techniques. He has been the Executive Chair of the International Conference on Information Fusion, Florence, Italy, 2006. He has been nominated Fellow of IEEE with the following citation: “For development and application of adaptive signal processing methods for radar systems.” Recently, he has been nominated international fellow of the Royal Academy of Engineering, UK; this fellowship was presented to him by HRH Prince Philip, the Duke of Edinburgh.


Papers are being collected from university researchers, from industries specialized in conceiving, designing, installing, operating and testing radar systems for civilian and defense applications. Authors are also invited from industries that provide instruments to test radar performances. The scope of the special session is to have a wide view of the methods, instruments and practical experience to test subsystems and radar systems.
Topics of relevance for the session are: instrument test equipment for verification and validation in the industry, at the customer site, on the operational fields. Automation and remote test equipment will be of special interest. Virtual reality technologies are also most welcome as topics of the session.

With the Patronage of